A probe station is an interface tool to measure the electrical characteristics of your microelectronic device.
The station requires a combination of a microscope and micro-positioners to facilitate the experiment. When integrated, users can accurately make contact to their devices with probes and measure with electronic meters to see the results.
Probe stations and probing solutions provide you with the means to achieve accurate measurements for DC or RF applications, for example achieving probing at terahertz frequencies.
With the latest in software developments, you can also achieve enhanced speed and productivity and increased test and measurement efficiency.
We recognise that you can often be challenged with difficult wafer probing and application-specific testing requirements and in order to meet these needs, creative solutions must be engineered.
Offering a complete set of accessories to allow you to position, navigate, determine signal fidelity, and contact the wafer or device under test. You can source the best ranges from us, covering every application need from starter probe solutions to complete probe stations.
We have technical experts that can help you narrow your requirements and choose the right device/probe/size for your application. Moreover, we can work with you on a customised solution, to enable a fast, accurate wafer data collection for complex applications and measurement requirements.
