LTE TDD Measurement Application

Manufacturer's part number :

V9082B

Manufacturer Agilent Technologies

Keysight Technologies

Description :

The LTE TDD measurement application helps you easily achieve your manufacturing test goals for today’s multi-format devices and femtocells. It quickly performs standards-based measurements for compliance with 3GPP Release 9. The EXM and EXF’s flexible sequencer uses single acquisition multiple measurement (SAMM) techniques to provide high-speed calibration and verification of your devices, modules or femtocells for maximum manufacturing throughput. Should issues arise, multiple color-coded result views help you quickly identify them for quick resolution. Using the LTE TDD measurement application with the EXM or EXF makes it easy to rapidly ramp up and optimize full-volume manufacturing.

  • Quote and availability

    Features

  • Supports measurements per 3GPP Release 9 standard
  • One-button, standards-based measurements with pass/fail tests
  • Superior measurement speed for wireless device manufacturing with multiple measurements from a single acquisition using the EXM uplink sequencer
  • Superior measurement speed for femtocell manufacturing with multiple measurements from a single acquisition using the EXF downlink sequencer
  • EXM for user equipment (UE) test: EVM, frequency error, I/Q offset, spectrum flatness, in-band emissions, transmit on/off power, SEM, ACP, and more
  • EXF for femtocell test: EVM, frequency error, DL RS Power, time alignment error, RSTP, RSRP, OSTP, transmit on/off power, SEM, ACLR and more
  • Multiple color-coded result views: EVM vs. subcarrier, EVM vs. symbol, EVM vs. slot, EVM vs. resource block (RB), detected allocations (subcarrier vs. symbol), error summary table, frame summary table, and more
  • License key upgradeable
  • Fixed and transportable licenses available
  • SCPI remote user interface