High Speed Source Monitor Unit, 2-Channels, High and Medium Power
Manufacturer's part number :
The Keysight Technologies E5263A lowers your cost-of-test by providing a high-speed parametric test solution for semiconductor, RFIC, and optical component testing needs. Key features include a high-speed DC measurement of current and voltage, enhanced measurement speed for fast throughput, expanded program memory, 16 digital I/O lines for sophisticated triggering requirements, and parallel test capability, all priced to affordably provide the ideal balance of functionality.
Basic and simple IV measurement can be made with the version 4.0 or later of Desktop EasyEXPERT. Available functions are limited. The latest Desktop EasyEXPERT is downloadable from "Related Product" under "Option & Accessories" with free of charge.
Engineers and scientists working on current and future semiconductor devices, monolithic microwave integrated circuits (MMICs), RFICs, and optical components require fast, flexible and robust instrument-based testing solutions to lower the cost-of-test. Testing requirements can be a moving target, which often frustrates efforts to predict testing needs in the future. The ideal answer is a solution that provides the exact testing resources needed today without exorbitant capital investment. Alternatives on the market consist of single SMUs, which present many challenges with respect to synchronization and achieving fast trigger response. Available alternatives also cannot always supply sufficient current to meet the testing needs of modern devices.
Quote and availability
- Perform high-speed, dc parametric measurements
- Fixed-configuration dual SMU instrument
- Basic and simple IV measurement via Desktop EasyEXPERT
- +/- 100 Volt and +/- 200 milliamp output capability (MPSMU)
- +/- 200 Volt and +/- 1 Amp output capability (HPSMU)
- 2.2 Amp ground unit